System Level Test
For the optical, electrical, and other properties of modules for new-generation display devices after power-on, this is a fully automated system for image capture, analysis, and testing. It is used for display function and defect detection during the power-on process of module segments after Micro LED dicing.
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Product Advantages
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01The self-developed Demura, AOI, and appearance detection algorithm quickly performs compensation during CSV data programming and detects defective points, lines, and appearance issues
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02The self-developed autofocus algorithm solves blurred imaging caused by an overly shallow depth of field of the camera
Product
Features
1. Provides automatic loading and unloading, and classification of non-defective and defective products
2. Provides uniformity and De-Mura compensation for Micro-LED/Micro-OLED modules to improve display quality
3. Simultaneously detects bright spots, dark spots, line defects, color difference, particles, scratches, cosmetic defects, and display anomalies.
4. Archives defect detection images and log data in real time to facilitate quality traceability
5. Connects to customer CIM systems to report production data in real time
