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Cn
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En
  • About SEICHITECH
  • Products
    • Memory ATE
    • SoC ATE
    • Probe Card
    • XR Inspection Equipment
    • AMOLED Inspection Equipment
  • Support
  • Technology Innovations
  • Investors
  • Careers
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Leading Micro-Display Inspection Technology to Empower Next-Gen Interactive Experiences for AI Terminals
XR Inspection Equipment
Leading Micro-Display Inspection Technology to Empower Next-Gen Interactive Experiences for AI Terminals
Memory ATE
  • Burn-in Equipment
  • Testers
SoC ATE
  • SoC ATE
Probe Card
  • Probe Card
XR Inspection Equipment
  • Wafer Inspection
  • Micro-display Module Aging
  • Micro-display Module Inspection
  • Near-eye Display (NED) Inspection
  • Signal Generator
  • Optical Instrument
AMOLED Inspection Equipment
  • Cell Process Equipment
  • Module Process Equipment
  • Signal Generator
  • Micro-display Module Aging

    Micro LED Burn-in Equipment

    Used for quality verification and burn-in testing in the development and design of modules for new-generation display devices, mass production, and when products are powered on, it provides...

    Micro LED老化设备-封面图
  • Micro OLED Burn-in Equipment

    Used for quality verification and burn-in testing in the development and design of modules for new-generation display devices, mass production, and when products are powered on, it provides...

    Micro OLED老化设备-封面图
Contact Information:

0755-83188629 - ext. 8001

Investors: jzd@seichitech.com

Support: sales@seichitech.com

Company Address:

52/F, Kingdee Cloud Tower, No.2 Keji South 12th Road, Nanshan District, Shenzhen

1/F, Building D, Fuanna Longhua Industrial Park, No.1 Qingning Road, Longhua District, Shenzhen

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