Chip Probing Tester
S9930 is a high-speed, high-precision DRAM chip probing and repair equipment launched by SEICHITECH to improve DRAM test efficiency and accuracy while reducing test costs.
Scroll to Explore
Product Advantages
-
01High Rate: Supports test data rate up to 2.25Gbps
-
02High Precision: Clock resolution is 3.47ps, supporting evolution to 1ps
-
03High Capacity: Supports 2,048 DUTs for parallel testing
-
04Self-Repair: Supports quick repair of defective chips
-
05Automation: Supports connection with mainstream probers for intelligent production
-
06Easy Operation: Supports various interactive modes such as command line and graphical user interface (GUI), and provides abundant visual tools and software interfaces
-
07Easy Upgrade: The whole architecture supports smooth evolution into the next generation of DRAM
-
08High Compatibility: Shares a set of host software with other SEICHITECH DRAM test equipment and is compatible with common C language test programs
-
09Easy Maintenance: Supports equipment self-diagnosis and optimization to reduce operation and maintenance costs
Product
Features
Target Devices
DDR4/5，LPDDR4/5
Test Data Rate
200MHz/400Mbps, which could upgrade to 1.125GHz/2.25Gbps
Parallel Testing Support
Supports 2048DUT per TD
Technical Parameters
Digital Channel: 4096 DR+5120 IO
Device Power Supply: 8192 DPS @1A
Edge Resolution: 3.47ps, which may evolve into 1ps
Timing Set: 16
DR/IO Range: -0.5V-1.9V/30mA
